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A low-cost insulating Cu-doped ZnO (Cu–ZnO) thin film has been utilized to form a Au/Cu–ZnO/p-Si type of metal–insulator–semiconductor (MIS) junction. The capacitance–voltage plot shows a nonvolatile memory effect through an anticlockwise hysteresis loop, indicating electron trapping and detrapping. The area of the hysteresis loop and the saturated capacitance value is found to be dependent on the...
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