The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
To precisely predict the life of optoelectronic displays over a short time, two life prediction models were established based on the three‐parameter Weibull right approximation method (TPWRAM). In Model I, the acceleration life under each stress was obtained using TPWRAM, the data points formed by acceleration life and acceleration stress were, respectively, fitted by three extrapolation functions...
To obtain precise life information for vacuum fluorescent displays (VFDs), luminance degradation data for VFDs were collected from a group of normal life tests. Instead of exponential function, the three‐parameter Weibull right approximation method (TPWRAM) was applied to describe the luminance degradation path of optoelectronic products, and two improved models were established. One of these models...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.