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Interlayer exchange coupling was investigated in Co2FeSi(20 nm)/Cr(tCr = 0.6 to 3 nm)/Co2FeSi(7 nm) epitaxial trilayer structures by M - H loop measurement and using a numerical simulation method. The epitaxial growth and the presence of partial B2 ordering in Co2FeSi films were confirmed from the XRD patterns. The bilinear coupling parameter J1 and 90?? coupling parameter J2 were determined from...
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