Search results for: Chris H. Kim
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385