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Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization...
High system voltage could increase the leakage current from the active cells/circuit to the grounded module frame. The leakage current could then lead to performance degradation, called potential induced degradation (PID). This study presents the PID results obtained on the fresh modules as well as the modules which were previously subjected to accelerated damp heat test (85°C/85%rh; 1000 hours) and...
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