Search results for: T. Bjorninen
Microelectronics Reliability > 2014 > 54 > 4 > 840-846
IEEE Antennas and Wireless Propagation Letters > 2012 > 11 > 1319 - 1322
2010 IEEE Sensors Applications Symposium (SAS) > 269 - 272
2010 IEEE Radio and Wireless Symposium (RWS) > 132 - 135