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Smart Power IC integrating high voltage devices with low voltage control blocks becomes more and more popular in automotive industry recently. Minority carriers injected into the substrate during switching of high power stages cause malfunction of sensitive nearby low voltage devices. Sometimes this may be destructive due to the presence of triggered latch up. The minority carriers propagation is...
When designing in Smart Power technologies, TCAD simulations are mandatory to design effective passive protections against parasitic couplings due to minority carriers. The objective of this paper is to propose a spice-based approach to characterize electrical key parameters of a passive protection directly within standard IC design flow avoiding time consuming TCAD simulations. Our methodology consists...
In smart power IC technology, low and high voltage circuits are integrated on the same substrate. The commutation of the high voltage circuits can induce substrate parasitic currents which can severely disturb the operation of the low voltage circuits. The parasitic currents due to minority carriers in the high voltage technology can be significantly high. However, the minority carrier propagation...
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