Search results for: Hiroshi Fuketa
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 463 - 470
IEEE Transactions on Nuclear Science > 2011 > 58 > 4-2 > 2097 - 2102
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 463 - 470
IEEE Transactions on Nuclear Science > 2011 > 58 > 4-2 > 2097 - 2102