Search results for: Yigang He
Journal of Electronic Testing > 2017 > 33 > 6 > 697-707
Analog Integrated Circuits and Signal Processing > 2017 > 91 > 3 > 445-461
Journal of Electronic Testing > 2016 > 32 > 5 > 531-540
IEEE Design & Test > 2016 > 33 > 3 > 77 - 90
Lecture Notes in Computer Science > Advances in Neural Networks – ISNN 2009 > Fault Diagnosis > 714-723
Journal of Electronic Testing > 2014 > 30 > 5 > 505-514
Neurocomputing > 2011 > 74 > 7 > 1102-1115
Analog Integrated Circuits and Signal Processing > 2011 > 66 > 1 > 93-102
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 3 > 586 - 595
Measurement > 2009 > 42 > 4 > 542-551
Analog Integrated Circuits and Signal Processing > 2009 > 61 > 1 > 87-92
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 11 > 2631 - 2639
Tsinghua Science & Technology > 2007 > 12 > Supplement 1 > 260-265
Journal of Electronics (China) > 1998 > 15 > 4 > 365-371