Search results for: H. Lin
2016 IEEE International Reliability Physics Symposium (IRPS) > 5B-2-1 - 5B-2-8
2015 IEEE International Reliability Physics Symposium > 2D.2.1 - 2D.2.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 3F.1.1 - 3F.1.5
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 322 - 326
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 330 - 332
Journal of Electronic Materials > 2006 > 35 > 8 > 1647-1654
Journal of Electronic Materials > 2005 > 34 > 1 > 27-33