Search results for: Lloyd W. Massengill
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 441 - 448
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 401 - 406
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 441 - 448
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 401 - 406