Search results for: G. Gielen
Microelectronics Reliability > 2008 > 48 > 8-9 > 1576-1580
2008 Design, Automation and Test in Europe > 1322 - 1327
Integration, the VLSI Journal > 2008 > 41 > 2 > 238-252
IEEE Transactions on Circuits and Systems II: Express Briefs > 2008 > 55 > 3 > 229 - 233
2008 European Conference on Wireless Technology > 362 - 365