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Low-dropout voltage regulator (LDO) is widely used in up-to-date electrical systems but with severe EMC problems. Its susceptibility prediction has become one of the major concerns both of IC suppliers before fabrication to avoid redesign cost and customers before real application to reduce incompatible. This paper presents a LDO susceptibility modeling study including IEC standard modeling flow and...
In this paper, a test chip is introduced to study the susceptibility of low dropout voltage regulator (LDO) by direct RF power injection (DPI) method. The structure and failure mechanism of LDO module is analyzed. Both of hardware and software DPI set-up are given to characterize the test flow. A novel test method of on-chip sensor sampling is described by the functional frame and sampling arithmetic...
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