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In this paper, a novel radiation-hardened-by-design (RHBD) 12T memory cell is proposed to tolerate single node upset and multiple-node upset based on upset physical mechanism behind soft errors together with reasonable layout-topology. The verification results obtained confirm that the proposed 12T cell can provide a good radiation robustness. Compared with 13T cell, the increased area, power, read/write...
In highly reliable CMOS integrated circuits, parasitic parameters have dramatic impacts on SER(soft error rate) estimation and affect the design decision. We proposed a circuit level SER characterization framework(ASSET-SPI) to evaluate the impacts by conducting statistical fault injection experiments automatically on the circuit spice netlist containing parasitic parameters. Experiments on ISCAS...
Soft error induced reliability problem has already become a major concern for modern SRAM-based FPGAs (Field Programmable Gate Arrays) even at the ground level. In this paper, we propose a duplication-with-recovery (DWR) technique to recover the configuration bit faults on interconnects, which contribute to the majority of soft errors in FPGAs. Based on a study on the detailed routing structure in...
Fault injection in circuit level has proved to be cumbersome and time-consuming when employed to characterize the soft error sensitivity of digital circuits, hence new generation of CAD tool is required to automate the faults insertion and the validation of soft error mitigation mechanisms of the circuits. This paper outlines the characteristics of a new fault-injection platform HSECT-SPI (HIT Soft...
Soft error, a concern for space applications in the past, became a critical issue in deep sub-micron VLSI design for the continuous technology scaling. Automated fault injection technique is employed to characterize the soft error sensitivity of VHDL based design and association analysis algorithm is firstly introduced into this realm to explore the fault dependency of the components in the design...
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