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In this paper, we focus on the detection of small gate-oxide defects, which can escape production tests but lead to early-life-failures (ELF) during normal operation. Very-Low-Voltage (VLV) and MinVDD testing have been proposed in the past to screen such “weak” ICs. However, small defects that are not severe enough to trigger logic failures can still escape such tests given the fact that power supply...
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