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Due to their high density, modern DRAMs are very susceptible to the interactions between adjacent cells, which in turn increases the difficulty and complexity of memory testing. In this work, we studied the interaction mechanisms among neighbouring DRAM cells in order to provide an efficient testing solution. According to the open literature, there are two mechanisms responsible for this interaction:...
Important characteristic of any VLSI circuit isits power consumption, reliability, operating speed and siliconarea. Dynamic CMOS designs provide high operating speedscompared to static CMOS designs combined with low siliconarea requirements. Pipelines can be used for achieving highcircuit operating speeds. However, as the operating frequencyincreases, the number of pipeline stages should also increaseand...
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