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This work reports the real-time Soft-Error Rate (SER) characterization of more than 7 Gbit of SRAM circuits manufactured in 40 nm CMOS technology and subjected to natural radiation (atmospheric neutrons). This experiment has been conducted since March 2011 at mountain altitude (2552 m of elevation) on the ASTEP Platform. The first experimental results, cumulated over more than 7,500 h of operation,...
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