Search results for: Zainalabedin Navabi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 7 > 2059 - 2070
IEEE Transactions on Computers > 2017 > 66 > 5 > 919 - 926
Integration, the VLSI Journal > 2016 > 55 > C > 183-193
Digital System Test and Testable Design > 213-259
Digital System Test and Testable Design > 175-212
Digital System Test and Testable Design > 345-373
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Digital System Test and Testable Design > 103-142