Search results for: Xiaowei Li
Journal of Electronic Testing > 2005 > 21 > 2 > 181-195
Journal of Electronic Testing > 2000 > 16 > 5 > 419-426
Journal of Electronic Testing > 2005 > 21 > 2 > 181-195
Journal of Electronic Testing > 2000 > 16 > 5 > 419-426