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High temperature and process variation are undesirable effects for modern systems-on-chip. The high temperature is a prominent issue during test and should be taken care of during the test process. Modern SoCs, affected by large process variation, experience rapid and large temperature deviations and, therefore, a traditional static test schedule which is unaware of these deviations will be suboptimal...
With new technologies, temperature has become an important issue to be considered at system level design. In this paper, we address the issue of leakage energy optimization through temperature aware idle time distribution (ITD). We propose an on-line ITD technique for leakage energy consumption minimization, where both static and dynamic idle time are considered. Experimental results have demonstrated...
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