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Single event sensitivity of bulk 40-nm sequential circuits is investigated as a function of temperature and supply voltage. The temperature dependence of single event upsets is different for relatively high supply voltage and ultra-low supply voltage. Single-event-transient induced errors in flip-flops are more sensitive to temperature variation than single event upsets.
Alpha particles are a critical reliability problem facing advanced technologies. This paper reports extensive tests over a wide range of technology nodes on CMOS SRAMs to study operating voltage, data pattern, operating frequency and operational-mode dependency of alpha particle induced single-event upsets rates.
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