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Non-uniform temperature profile generated by hot- spots affect the nearby units in a chip. Different sections of a large sized cache memory would experience different failure statistics due to their proximity to the hot-spots. The nano-scaled SRAM (Static Random Access Memory) cell stability is analyzed systematically under such 'spatial' temperature variations for different technologies. The bitcell...
Different sections of a cache memory may experience different temperature profiles depending on their proximity to other active logic units such as the execution unit. In this paper, we perform thermal analysis of cache memories under the influence of hot-spots. In particular, 8-T SRAM bit cell is chosen because of its robust functionality at nano-scaled technologies. Thermal map of entire 8-T SRAM...
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