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To assess the reliability of a high-reliability and complicated system, a reliability assessment method of multi-state system (MSS) based on an accelerated degradation testing (ADT) is proposed. Firstly, the degradation data for ADT is transferred to the data for normal stress test through the acceleration model. According to the transferred data, degradation track and distribution parameters of system...
Reliability is emerging as an important constraint for future microprocessors. Cooperative hardware and software approaches for error tolerance can solve this hardware reliability challenge. Cross-layer fault tolerance frameworks expose hardware failures to upper-layers, like the compiler, to help correct faults. Such cooperative approaches require less hardware complexity than masking all faults...
This paper applies the Importance-Satisfaction model to improve the effectiveness of the sea transportation for the Taiwanese Armed Forces as a case study. Data from experts is used to examine the military supply transportation by sea in outlying islands and we find that reliability of advertised sailing schedules and willingness to negotiate. These two items should be improved as soon as possible,...
With technology scaling, manufacture-time and in-field permanent faults are becoming a fundamental problem. Multi-core architectures with spares can tolerate them by detecting and isolating faulty cores, but the required fault detection coverage becomes effectively 100% as the number of permanent faults increases. Dual-modular redundancy(DMR) can provide 100% coverage without assuming device-level...
As technology scales, device reliability is becoming a fundamental problem. Even though manufacture test can guarantee product quality, due to various types of wearout and failure modes, permanent faults appear in the filed is becoming an increasingly important and real problem. Such types of wear-out creates permanent faults in devices during their lifetime, but after release to the user. In this...
Although a significant effort was made recently in the development of binary oxide based resistive memory (RRAM), reliability issue is still the most concern, but less addressed. By stressing the device in high resistance state (HRS) with constant voltage of the same bias polarity during SET process, the disturbed time is found to exhibit extreme low Weibull slope (~0.3). This characteristic can drastically...
A production-loss based maintenance plan is proposed to minimize the cost due to unscheduled ATE (automatic test equipment) downtime in the back-end process of semiconductor manufacturing. This paper suggests two methods, active redundancy and cold standby redundancy, to expedite the ATE system repair time for returning the system back to production. This strategy is different from other reliability...
Impact of reliability growth on repairable inventory with the application to semiconductor test equipment is discussed and analyzed in this paper. Semiconductor test equipment is capital-intensive product built with swappable and repairable modules (i.e. printed-circuit-boards) to facilitate the maintenance and repair of the system. A stochastic inventory model is proposed to estimate the demand rate...
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