Search results for: Jing Han
Journal of Electronic Materials > 2018 > 47 > 7 > 4156-4164
Journal of Electronic Materials > 2018 > 47 > 4 > 2479-2487
Journal of Electronic Materials > 2018 > 47 > 1 > 124-132
Microelectronics Reliability > 2017 > 71 > Complete > 126-133
Journal of Electronic Materials > 2011 > 40 > 12 > 2470-2479