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A SrTiO3 thin film was deposited on a MgAl2O4(100) substrate with a 3.5 % larger lattice constant than that of the SrTiO3. The temperature dependence of the dielectric dispersion of the SrTiO3 thin film was measured by terahertz time-domain spectroscopy, and the dielectric strength and soft-mode frequency showed positive and negative peaks at around 170 K, respectively. In addition, a deviation of...
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