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We developed models for Type-N coaxial vector network analyzer (VNA) calibration kits within the NIST Microwave Uncertainty Framework. First, we created physical models of commercially-available standards that support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and included error mechanisms in each of the standards' constituent parameters that were utilized in the...
We developed physical models of commercially-available 2.4 mm and 3.5 mm coaxial calibration kits for vector network analyzers. These models support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and include error mechanisms in each of the standards' constituent parameters that can be utilized in the NIST Microwave Uncertainty Framework to propagate uncertainties....
We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a chain of components, including a coaxial-to-waveguide adapter, a waveguide band-pass filter, a waveguide low-noise amplifier, a waveguide isolator,...
We present a technique to characterize and correct for linear and weakly nonlinear distortion introduced by the nonideal response of a wideband, high-frequency modulated-signal source. The magnitude and phase relationships between frequency components in a measured modulated signal are maintained by use of a calibrated equivalent-time sampling oscilloscope. The nonidealities of the oscilloscope and...
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform measurements and the SI. These services are increasingly...
We present a method for establishing traceability of a commercial electronic calibration unit for vector network analyzers by characterizing the scattering parameters of its internal states with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic calibration unit characterized, we use it to calibrate...
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