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In this paper we present an analytical analysis of the fault masking capabilities of triple modular redundancy (TMR) hardening techniques in the presence of multiple cell upsets (MCUs) in the configuration memory of SRAM-based field-programmable gate arrays (FPGAs). The analytical method we developed allows an accurate study of the MCUs provoking domain crossing errors that defeat TMR. From our analysis...
In this paper we present an analytical analysis of the fault masking capabilities of triple modular redundancy (TMR) hardening technique in the presence of multiple cell upsets (MCUs) in the configuration memory of SRAM-based FPGAs. The analytical method we developed allow an accurate study of the MCUs sensitiveness characterizing the orientation and the effects provoking multiple domain crossing...
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