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In mobile systems, the problems of short battery life and increased temperature are exacerbated by wasted leakage power. Leakage power waste can be reduced by power-gating a core while it is stalled waiting for a resource. In this work, we propose and model memory access power gating (MAPG), a low-overhead technique to enable power gating of an active core when it stalls during a long memory access...
Timing exceptions in IC implementation processes, especially timing verification, help reduce pessimism that arises from unnecessary timing constraints by masking non-functional critical paths. Ideally, timing exceptions should always be helpful for quality of results (QOR) metrics such as area or number of timing violations, and for design turnaround time (TAT) metrics such as tool runtime and number...
Conventional CAD methodologies optimize a processor module for correct operation, and prohibit timing violations during nominal operation. In this paper, we propose recovery-driven design, a design approach that optimizes a processor module for a target timing error rate instead of correct operation. We show that significant power benefits are possible from a recovery-driven design flow that deliberately...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling. Any scaling beyond the critical voltage results in exceeding the maximum allowable error rate, i.e., there are more timing errors than can be effectively and gainfully detected or corrected by an error-tolerance mechanism. This limits the effectiveness of voltage scaling as a knob for reliability/power...
Modern digital IC designs have a critical operating point, or “wall of slack”, that limits voltage scaling. Even with an error-tolerance mechanism, scaling voltage below a critical voltage - so-called overscaling - results in more timing errors than can be effectively detected or corrected. This limits the effectiveness of voltage scaling in trading off system reliability and power. We propose a design-level...
Modern digital IC designs have a critical operating point, or ??wall of slack??, that limits voltage scaling. Even with an error-tolerance mechanism, scaling voltage below a critical voltage - so-called overscaling - results in more timing errors than can be effectively detected or corrected. This limits the effectiveness of voltage scaling in trading off system reliability and power. We propose a...
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