Search results for: Jean-Baptiste Begueret
Journal of Electronic Testing > 2010 > 26 > 3 > 355-365
2009 European Microwave Conference (EuMC) > 401 - 404
Journal of Electronic Testing > 2010 > 26 > 3 > 355-365
2009 European Microwave Conference (EuMC) > 401 - 404