Search results for: Neng Chen
IEEE Electron Device Letters > 2013 > 34 > 1 > 102 - 104
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 209 - 216
IEEE Electron Device Letters > 2013 > 34 > 1 > 102 - 104
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 209 - 216