Search results for: J.D. Cressler
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 1938 - 1945
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 479 - 487
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 1938 - 1945
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 479 - 487