Search results for: F. Blaabjerg
Microelectronics Reliability > 2014 > 54 > 9-10 > 1655-1660
Archives of Electrical Engineering > 2014 > Vol. 63, nr 1 > 63-79
2013 IEEE Energy Conversion Congress and Exposition > 1696 - 1701
2013 IEEE Energy Conversion Congress and Exposition > 2289 - 2295
Microelectronics Reliability > 2013 > 53 > 9-11 > 1788-1792