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In this paper, the design and use of an in-situ tuner (IST) aiming on-wafer multi-impedance method are presented. The conventional method using off-wafer tuner is limited by the frequency range and has losses between this external Tuner and the device under test (DUT). Here, IST is placed near the DUT to achieve higher |Gamma| and to cancel losses between the impedance generator and the device. The...
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