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In this paper, a new hysteresis modeling method based on an improved sub-pixel blocking matching algorithm with an optimal block size and the Preisach model is proposed to model the hysteresis behavior of a nano piezoelectric actuator (PA) on nano scale in a real time system. First, the Preisach model about the hysteresis behavior of a piezoelectric actuator is introduced. Then, a real time block...
Principle of atomic force microscope (AFM) is on the basis of cantilever's deflection. However, up to now, there are still no effective methods to model the cantilever's deflection with high precision, which will usually result in a poor measurement accuracy of AFM and has greatly limited further applications of AFM in more different fields. Thus, a global shape from defocus method, which is only...
One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparticle can be stable controlled within a known area, while this prerequisite is still hindered by the uncertainties including the initial position of the nanoparticle and of the AFM tip, together with the uncertain forces from the substrate and so on. In this paper, a Stochastic Pushing (SP) model and...
In developing nano-devices and nano-structures, traditional methodologies on MEMS meet the difficulty from the scale restriction. With the strategy of objects assembly, using AFM to handle nano-rods and other nano-objects is considered as an important and high potential technology in constructing nano-structures. However most of AFM only has one tip as the end effector and cannot control both translational...
Nanomanipulation and nanoassembly using atom force microscopy (AFM) is a potential and promising technology for nanomanufacturing. Precise position of the tip of AFM is important to increase the accuracy and efficiency on fabricate complex nanostructures. However at the nano-scale, it is difficult to acquire the tip position expressed by the coordinate in real time due to PZT nonlinearity and thermal...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AFM only has one sharp tip as the end-effector. The interaction force between the nanoparticle and the tip is applied through a single point, which often leads the AFM tip to slip-away from the nanoparticle due to their small touch area. Then several minutes is needed to relocate the missed nanoparticle...
Reconstruction depth from 2D images is an important research issue in computer vision, and depth from defocus (DFD) is an effective way which takes the blurred degree of the region images whose depth of field is limit as the tool of computing depth. Now though there are many DFD methods, they all need to change camera parameters in order to attain blurred images, such as the focal length of the lens,...
As one of the renewable energy, the absorption and utilization of wave energy is always an important research field home and abroad, and energy absorption efficiency is the key. A wave energy absorption system based on inertial pendulum is presented, and dynamics equations are established. Neural network with learning rate adaptation is adopted to model in time domain. The results obtained by simulation...
A novel method based on vibration-mode of the atomic force microscope (AFM) for nanoimaging and nanomanipulation is introduced in this paper. With this approach, the amplitude of OMSPV (opto-electronic measurement signal of probe vibration) can be used as a feedback signal to detect and control the operation state under vibration-mode. By controlling the amplitude of AFM probe, the tip-sample interaction...
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