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In recent years there has been an extensive interest in clustering the modules of a network so that the maximum delay from any primary input to any primary output is minimized. Clusters have a maximum capacity, pin limitations and modules have different implementations. Furthermore, different implementations may have different areas. All existing CAD frameworks initially select an implementation of...
The generation of pseudoexhaustive test sets for the built-in self-test (BIST) of combinational circuits is addressed, using as a test pattern generator a simple linear feedback register (LFSR), structure, known as LFSR/SR. It is shown that particular orderings of the LFSR cells can significantly reduce the test set size. In addition, it is shown that an LFSR/SK designed with a particular cell ordering...
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