Wyniki wyszukiwania dla: M. Vainio
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 2 > 500 - 504
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 2 > 239 - 243
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 2 > 500 - 504
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 2 > 239 - 243