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As technology scales, the aging effect caused by negative bias temperature instability (NBTI) has become a major reliability concern. In the mean time, reducing leakage power remains to be one of the key design goals. Because both NBTI-induced circuit degradation and standby leakage power have a strong dependency on the input vectors, input vector control (IVC) technique could be adopted to reduce...
Terahertz (THZ) detection by field effect transistors (FETs) has been paid great attention in recent years. This paper outlined the numerical study of terahertz radiation detection by FETs in our group, including the fundamental THz detection model, detection model with two sources, heterodyne detection model and optical beating model. These study results demonstrated the potential application of...
As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, reducing leakage power remains to be one of the design goals. Because both NBTI-induced circuit degradation and standby leakage power have a strong dependency on the input vectors, Input Vector Control (IVC) technique may be...
Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool...
Circuit failure prediction is used to predict occurrences of circuit failures, during system operation, before errors appear in system data and states. This technique is applicable for overcoming major scaled-CMOS reliability challenges posed by aging mechanisms such as Negative-Bias-Temperature-Instability (NBTI). This is possible because of the gradual nature of degradation associated with such...
Accurate prediction of circuit aging and its variability is essential to reliable design and analysis. Such a capability further helps reduce the load in statistical reliability test. Based on compact models of transistor degradation and circuit performance, we develop analytical solutions that efficiently predict the statistics of both circuit timing and the leakage under temporal stress and process...
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