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A new type of depth-resolved soft X-ray photoemission spectroscopy (SXPS) is carried out in which depth sensitivity is provided by means of a periodic multilayer {[B 4 C(22.5 9)-W(17.1 9)] 40 } that possesses sizeable standing wave effects of +/-~50-60% for soft X-rays at hν~750eV. The photoelectron intensities of each element in the sample, including impurity overlayers, are...
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