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In the deep-submicrometer design regime, RF circuits are expected to be increasingly susceptible to process variations, and thereby suffer from significant loss of parametric yield. To address this problem, a postmanufacture self-tuning technique that aims to compensate for multiparameter variations is presented. The proposed method incorporates a ??response feature?? detector and ??hardware tuning...
CMOS technology scaling along with the resulting large variability of circuit performance has made post-silicon circuit and algorithmic level built-in test and adaptation/tuning almost a necessity for deeply scaled technologies. Currently, circuits are designed to tolerate worst-case process corners. In addition, circuits as well as demodulation/signal processing algorithms must be designed for worst...
In production testing of wireless systems, measurement of EVM (a critical spec that is directly related to bit error rate) incurs significant test time due to the large numbers of symbols that need to be transmitted for reasons of accuracy. In our approach, EVM is modeled as a function of the system static non-idealities (IQ mismatch, gain, IIP3 parameters) and dynamic non-idealities (system noise,...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
Polar radio architectures are gaining in popularity due to the promise of an all digital implementations in future CMOS systems-on-chip (SoCs) solutions. Test cost is an important consideration for manufacturers developing these complex devices. Phase noise is an important specification in all digital polar radios as it affects the signal modulation quality. In this paper, a low cost test technique...
In this paper, a novel adaptive calibration technique for advanced RF front-ends is proposed in which sensors are implanted in the transmitter and the observed device test response to a special calibration test is compared against the known golden response to the same. Tuning 'knobs' which are built into the circuit are then used to minimize the error between the observed response and the golden response...
As channel conditions in wireless communications improve, the noise performance of the baseband DSP processor can be degraded to save power without compromising bit error rate. The degradation of baseband signal noise is achieved by degrading the noise performance (reducing the wordlength and supply voltage) of the various baseband signal processing modules in specific proportions defined by a locus,...
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