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In this paper, a fast RF BIST-driven post-manufacture tuning methodology for yield improvement of RF transceiver systems is presented. The core algorithms optimize multiple transceiver performance metrics concurrently using a hardware-iterated gradient search algorithm that uses diagnostic BIST data to guide the tuning of circuit and software level parameters. Intelligent ??initial guess?? values...
Design and test of high-speed mixed-signal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, post-manufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune...
The recent demand in wireless standards capable of providing short-range, high-speed data transfer has accelerated the growth of the Ultra-Wide Band (UWB) standard. MB-OFDM (Multi Band Orthogonal Frequency Division Multiplexing) UWB devices suffer from frequency dependent non-idealities due to extreme wideband operation (3.1 to 10.6 GHz). Further these characteristics are subjected to process variations...
CMOS technology scaling along with the resulting large variability of circuit performance has made post-silicon circuit and algorithmic level built-in test and adaptation/tuning almost a necessity for deeply scaled technologies. Currently, circuits are designed to tolerate worst-case process corners. In addition, circuits as well as demodulation/signal processing algorithms must be designed for worst...
We propose a technique for low-cost testing of radio-frequency components integrating current signatures and alternate test methodology. The technique is suitable for non-invasive built-in test as well as low-cost automated test equipment (ATE) applications. Main features of the technique are (1) minimum loading on signal path by sampling supply current, (2) flexible test stimulus generation based...
Current wireless transceiver systems employ power-up self-calibration to enhance quality-of-service (QoS) for end-users. This is mostly performed by firmware (embedded software) within the digital signal processor (DSP) and automatic gain control (AGC) circuits in baseband. This self-calibration step by itself may not be effective to compensate for environmental effects. Moreover, these techniques...
Due to aggressive technology scaling, parametric failure diagnosis of RF transceiver modules is becoming important for rapid yield ramp-up. In this paper, a low cost diagnosis approach is proposed that is amenable to built-in diagnosis of RF transceivers via diagnostic algorithms running on the transceiver DSP. The method relies on the use of a single sensor at the transmitter output that eliminates...
To address growing production test costs, a low-cost built-in test solution for RF circuits is proposed that is robust to process, supply voltage and temperature variations (PVT variations). The test solution consists of measuring the envelope of the output response to a two-tone test stimulus. This is a relatively low frequency signal compared to the nominal frequency of the RF device under test...
As new standards are developed, designing and developing tests for the new devices conforming to the emerging standards has become a necessity. Designing new products for emerging standards needs focused effort from design engineers. In a similar manner, test is becoming a critical part of the manufacturing cycle due to escalating tester costs, as the testing requirements for every standard are different...
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