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Despite best efforts, integrated systems are “born” (manufactured) with a unique ‘personality’ that stems from our inability to precisely fabricate their underlying circuits, and create software a priori for controlling the resulting uncertainty. It is possible to use sophisticated test methods to identify the best-performing systems but this would result in unacceptable yields and correspondingly...
Despite best efforts, integrated systems are “born” (manufactured) with a unique ‘personality’ that stems from our inability to precisely fabricate their underlying circuits, and create software a priori for controlling the resulting uncertainty. It is possible to use sophisticated test methods to identify the best-performing systems but this would result in unacceptable yields and correspondingly...
SRAM design in scaled technologies requires knowledge of phenomena at the process, circuit, and architecture level. Decisions made at various levels of the design hierarchy affect the global figures of merit (FoMs) of an SRAM, such as, performance, power, area, and yield. However, the lack of a quick mechanism to understand the impact of changes at various levels of the hierarchy on global FoMs makes...
A designer's intent and knowledge about the critical issues and trade-offs underlying a custom circuit design are implicit in the simulations she sets up for design creation and verification. However, this knowledge is tightly conjoined with technology-specific features and decoupled from the final schematic in traditional design flows. As a result, this knowledge is easily lost when the technology...
Transistor sizing to control random mismatch is investigated. Input offset voltage of 65 nm bulk CMOS SRAM sense amplifiers are measured to analyze NMOS and PMOS threshold voltage (Vtn, Vtp) variation effects and compare them with statistical models and Pelgrom model predictions. A linear statistical response surface model (RSM) relating input offset to Vtn and Vtp is shown to agree well with measured...
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