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N-Modular Redundancy (NMR) is the most commonly used failure mitigation technique, in which a voting unit is used to vote out the wrong path/data. The voter is, therefore, vital for nanoscale analog and digital circuits in which high defect rate is expected. In this paper, we propose a redundancy based fault-tolerant methodology to design fault tolerant analog filters. The key contribution of our...
Negative Bias Temperature Instability and Channel Hot Career degrades the life time of both the analog and digital circuits significantly and should be a major concern in nanoscale regime. These problems are usually addressed by leaving large design margins (called overdesign) or employing complicated calibration algorithm both of which result in larger area as well as excessive power consumption...
Analog and digital circuits are both prone to failure due to transient upsets, variations, etc. Redundancy techniques, such as N-tuple Modular Redundancy, has been widely used to correct faulty behavior of components and achieve high reliability for digital circuits, whereas, not much has been done on the analog side. In this paper, we propose a redundancy based fault-tolerant methodology to design...
In this paper, we propose a distributed voting strategy to design a robust NMR system. We show that using inexpensive current-based drivers and buffers, we can completely eliminate the centralized voter unit and do the majority voting among N modules in a distributed fashion. Our strategy achieves high reliability that is vital for future nano systems in which high defect rate is expected. Experimental...
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