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We developed channel‐dimension‐scalable oxide TFT technology. To provide scalability, AlO sputtered self‐aligned source/drain, shield metal and AlO passivation structures were introduced. High reliability achieved by trap reduction using an undercoat offered display lifetimes of >10 years and gate driver integration. A 352‐ppi printed organic‐light‐emitting diode display demonstrated the technology's...
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