Search results for: L. Clavelier
Microelectronics Reliability > 2012 > 52 > 11 > 2602-2608
2011 International Electron Devices Meeting > 7.3.1 - 7.3.4
Microelectronic Engineering > 2011 > 88 > 12 > 3432-3436
Microelectronic Engineering > 2011 > 88 > 7 > 1265-1268
Solid State Electronics > 2011 > 59 > 1 > 8-12
Solid State Electronics > 2011 > 59 > 1 > 34-38
Microelectronic Engineering > 2011 > 88 > 4 > 331-335
Applied Surface Science > 2011 > 257 > 7 > 3007-3013
2010 International Electron Devices Meeting > 2.6.1 - 2.6.4
Diamond & Related Materials > 2010 > 19 > 7-9 > 796-805
Solid State Electronics > 2010 > 54 > 2 > 158-163