Search results for: B. Narasimham
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 157 - 163
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 157 - 163
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121