Search results for: A. Boni
2006 IEEE International Symposium on Circuits and Systems > 4 pp. - 5719
IEEE Transactions on Circuits and Systems II: Express Briefs > 2006 > 53 > 6 > 429 - 433
Measurement > 2005 > 37 > 4 > 344-351
2006 IEEE International Symposium on Circuits and Systems > 4 pp. - 5719
IEEE Transactions on Circuits and Systems II: Express Briefs > 2006 > 53 > 6 > 429 - 433
Measurement > 2005 > 37 > 4 > 344-351