Search results for: H. Blanck
Microelectronics Reliability > 2017 > 76-77 > C > 338-343
Microelectronics Reliability > 2016 > 64 > C > 541-546
Microelectronics Reliability > 2014 > 54 > 9-10 > 2237-2241
Microelectronics Reliability > 2014 > 54 > 9-10 > 2213-2216
Microelectronics Reliability > 2013 > 53 > 9-11 > 1439-1443
Microelectronics Reliability > 2013 > 53 > 9-11 > 1450-1455
Microelectronics Reliability > 2012 > 52 > 12 > 3022-3025
Microelectronics Reliability > 2012 > 52 > 9-10 > 2200-2204
Microelectronics Reliability > 2010 > 50 > 9-11 > 1543-1547
2010 IEEE MTT-S International Microwave Symposium > 1392 - 1395