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We present an easy to use method to extrapolate digital circuit performance and power from nominal to worst-case operating conditions. It allows the circuit designer to explore the design space over a continuous rage of voltages and temperatures and for different process conditions. Voltage scaling is identified as a key challenge for the 22 nm technology node.
Performance improvement of an ARM926 microprocessor core by selective replacement of standard master-slave flip flops using low-VT flip flops or a novel type of pulsed flip flop (P-FF) is investigated. Different replacement strategies are proposed that are independent of path and pipeline topologies. These strategies are compared to each other concerning performance improvement and costs. For an existing...
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