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The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point strain uncertainty of 10...
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