Search results for: F. Campabadal
Nuclear Inst. and Methods in Physics Research, A > 2005 > 552 > 3 > 292-328
Nuclear Inst. and Methods in Physics Research, A > 2005 > 552 > 1-2 > 27-33
Nuclear Inst. and Methods in Physics Research, A > 2005 > 552 > 1-2 > 7-19
Solid State Electronics > 2005 > 49 > 9 > 1536-1546
Nuclear Inst. and Methods in Physics Research, A > 2005 > 548 > 3 > 355-363
Nuclear Inst. and Methods in Physics Research, A > 2005 > 546 > 1-2 > 99-107
Nuclear Inst. and Methods in Physics Research, A > 2005 > 541 > 1-2 > 189-201
Nuclear Inst. and Methods in Physics Research, A > 2005 > 538 > 1-3 > 384-407
Conference on Electron Devices, 2005 Spanish > 513 - 516
Microelectronic Engineering > 2004 > 72 > 1-4 > 85-89
Nuclear Inst. and Methods in Physics Research, A > 2003 > 512 > 1-2 > 52-59
Sensors & Actuators: A. Physical > 2003 > 105 > 3 > 311-319
Solid State Electronics > 2001 > 45 > 8 > 1391-1401
Nuclear Inst. and Methods in Physics Research, A > 2001 > 466 > 2 > 308-326
Nuclear Inst. and Methods in Physics Research, A > 2001 > 465 > 1 > 60-69
Microelectronics Reliability > 2000 > 40 > 8-10 > 1567-1572
Microelectronics Reliability > 2000 > 40 > 4-5 > 743-746
Microelectronics Reliability > 2000 > 40 > 4-5 > 791-794
Microelectronics Reliability > 1999 > 39 > 6-7 > 869-874